24 August 1992 New method of fringe pattern trace and analysis
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Abstract
Centroid and geometric center methods are suggested for tracing the center location of an irregular interferogram in this paper. The methods remove limitations of general software which may only analyze straight or quasi-straight fringe patterns. The F-test method is used to control accuracy of fringe analysis. The speed and accuracy of the software depend upon the quality of the fringe pattern and a number of sample points.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Guiying Wang, Guiying Wang, Aiming Sun, Aiming Sun, Jun Ren, Jun Ren, ZhiJiang Wang, ZhiJiang Wang, } "New method of fringe pattern trace and analysis", Proc. SPIE 1704, Advances in Optical Information Processing V, (24 August 1992); doi: 10.1117/12.139903; https://doi.org/10.1117/12.139903
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