A High Accuracy Surface Contour Measuring Machine

Daniel Bajuk

doi:10.1117/12.957049

4 April 1979 A High Accuracy Surface Contour Measuring Machine

Daniel Bajuk

Proceedings Volume 0171, Optical Components: Manufacture and Evaluation; (1979) https://doi.org/10.1117/12.957049
Event: Los Angeles Technical Symposium, 1979, Los Angeles, United States

Abstract

A surface contour measuring machine is described which can measure general aspheric or axi-symmetric aspheric surfaces repeatably to .000005 inches or better in most cases. The computer system which controls the measuring machine and which performs the data analysis is discussed. Aspheric production applications are shown in which the measuring machine plays a vital role.

Citation Download Citation

Daniel Bajuk "A High Accuracy Surface Contour Measuring Machine", Proc. SPIE 0171, Optical Components: Manufacture and Evaluation, (4 April 1979); https://doi.org/10.1117/12.957049

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available