24 September 1993 Wavelengthometry by double-refracting interferometry
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Proceedings Volume 1711, High-Performance Optical Spectrometry; (1993) https://doi.org/10.1117/12.155681
Event: High Performance Optical Spectrometry, 1992, Warsaw, Poland
A double-refractig interference system with variable wavefront shear has been adapted to wave- lengthmetry ot nochromatic light. The interfrixige spacing is directly measured while the wavelength is read out frog a calibration plot or a data table stored in the computer mery. The proposed technique is especially suitable or aauring the peak wavelength o nocbroatic intererence filters. The measuring accuracy as good as Al = m is easily achievable.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maksymilian Pluta, Maksymilian Pluta, } "Wavelengthometry by double-refracting interferometry", Proc. SPIE 1711, High-Performance Optical Spectrometry, (24 September 1993); doi: 10.1117/12.155681; https://doi.org/10.1117/12.155681

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