9 February 1993 DC substitution methods in metrology
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Proceedings Volume 1712, 14th Symposium on Photonic Measurement; (1993) https://doi.org/10.1117/12.140162
Event: 14th Symposium of the TC2 on Photonic Measurements, 1992, Sopron, Hungary
Abstract
DC substitution methods are used for the measurement of a wide range of physical parameters across the whole electromagnetic spectrum. A summary is given of the principles involved with a view to alerting users of such techniques in the area of optical radiation measurement to related work in other areas of metrology. Because of the similarity of the methods, much useful information and insight can be gained from such a wider perspective. This applies to both the striking similarity of the techniques and the analysis of required instrumental corrections.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Franz Hengstberger, Franz Hengstberger, } "DC substitution methods in metrology", Proc. SPIE 1712, 14th Symposium on Photonic Measurement, (9 February 1993); doi: 10.1117/12.140162; https://doi.org/10.1117/12.140162
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