10 March 1993 Fourier transform infrared spectroscopy for process monitoring and control
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Abstract
An important requirement in many industries is the ability to perform on-line monitoring and control of harsh, multi-phase process streams. During the last ten years, significant progress has occurred in the hardware and applications for Fourier transform infrared (FT-IR) spectroscopy. Instrumentation is now available which can perform, in harsh environments, continuous unattended and simultaneous measurements of absorbed (or reflected) and emitted radiation. The applications of FT-IR include: (1) concentrations of multiple species and phases (gases, liquid, particles, surfaces) as low as ppb; (2) temperatures of multiple species and phases (gases, liquid, particles, surfaces) with accuracies as good as +/- 1 degree(s)C at any elevated temperature; (3) measurement of particle sizes; (4) measurement of film thickness; (5) in-situ line-of-sight data; (6) in-situ spatially resolved data using tomography; (7) data on extracted samples; and (8) data on time scales as short as a few milliseconds.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Peter R. Solomon, Peter R. Solomon, Philip W. Morrison, Philip W. Morrison, Michael A. Serio, Michael A. Serio, Robert M. Carangelo, Robert M. Carangelo, James R. Markham, James R. Markham, Stephen C. Bates, Stephen C. Bates, Joseph E. Cosgrove, Joseph E. Cosgrove, } "Fourier transform infrared spectroscopy for process monitoring and control", Proc. SPIE 1717, Industrial, Municipal, and Medical Waste Incineration Diagnostics and Control, (10 March 1993); doi: 10.1117/12.140295; https://doi.org/10.1117/12.140295
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