20 October 1992 Precision polarimetry of optical components (Invited Paper)
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132140
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements are described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell A. Chipman, Russell A. Chipman, } "Precision polarimetry of optical components (Invited Paper)", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132140; https://doi.org/10.1117/12.132140


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