20 October 1992 Precision polarimetry of optical components (Invited Paper)
Author Affiliations +
Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132140
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
Polarization elements at present are inadequately characterized for many applications. For retarders, usually only the retardance is specified. For polarizers, usually only the two principal transmittances or the extinction ratio are given. For polarization elements used in critical applications, this level of characterization is woefully inadequate. Defects of polarization elements are described, and appropriate performance measures suggested. Examples of the characterization of polarization elements as a function of angle of incidence, and as a function of wavelength are provided.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Russell A. Chipman, Russell A. Chipman, } "Precision polarimetry of optical components (Invited Paper)", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132140; https://doi.org/10.1117/12.132140
PROCEEDINGS
11 PAGES


SHARE
RELATED CONTENT

Imaging polarimeters for optical metrology
Proceedings of SPIE (September 30 1990)
Precision polarimetry of polarization components
Proceedings of SPIE (December 10 1992)
Broadband (UV-VIS-NIR) Mueller matrix polarimeter
Proceedings of SPIE (September 09 2011)
Advances in polarization metrology
Proceedings of SPIE (November 05 2003)
Polarimetry: measurements, error analysis, and application
Proceedings of SPIE (August 26 2005)
High-speed imaging polarimeter
Proceedings of SPIE (December 11 2003)

Back to Top