20 October 1992 Scattering characteristics of dielectric optical multilayers in visible region
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132121
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
A scattering measurement apparatus equipped with a halogen lamp and an integrating sphere was constructed. The scattering characteristics of ZrO2/SiO2 multilayers were measured in the visible region. The scattering characteristics did not only follow (lambda) -4 relation but also depended on the optical characteristics. It was shown that the electric field intensity distributions qualitatively explained the scattering characteristics. Also, the apparatus was useful as an instrument to find out the optimum deposition conditions of multilayers.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Takayuki Akiyama, Takayuki Akiyama, } "Scattering characteristics of dielectric optical multilayers in visible region", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132121; https://doi.org/10.1117/12.132121
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