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20 October 1992 Two-dimensional birefringence measurement using the phase-shifting technique
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132141
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
We propose a two-dimensional birefringence measurement method. A linearly polarized light goes through a Babinet-Soleil compensator whose principle axis direction is set 45 degree to the incident light. The light is affected by the birefringence when it passes through an optical sample. The interference fringe behind a linear polarizer is captured wholly as a two- dimensional image by a CCD camera. The data is analyzed into the phase information by the phase shifting technique using a Babinet-Soleil compensator. Here the obtained phase changes sinusoidally. Its amplitude and phase mean the relative retardation and azimuth angle respectively when a polarization azimuth of the incident light is rotated. A half-wave plate as a phase shifter is used again to obtain this amplitude and phase using the phase shifting technique again. We discuss these experimental procedures and results applied to such optical components as a lens and a roof prism.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yukitoshi Otani, Takuya Shimada, Toru Yoshizawa, and Norihiro Umeda "Two-dimensional birefringence measurement using the phase-shifting technique", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132141
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