Two-wavelength laser-diode interferometry with electronic calibration techniques

Ribun Onodera; Yukihiro Ishii

doi:10.1117/12.132155

20 October 1992 Two-wavelength laser-diode interferometry with electronic calibration techniques

Ribun Onodera, Yukihiro Ishii

Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132155
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan

Abstract

A two-wavelength laser-diode (LD) interferometer has been constructed that is based on a phase-shifting technique with an electronic calibration. The phases are equally shifted in opposite directions to each other on an unbalanced interferometer using two wavelengths changed stepwise by separately varying the currents in dual LDs. A feedback interferometer is described with electronics to calibrate the phase shifts and to lock the interferometer on a phase-shift condition by controlling the bias and modulation currents of both LDs. The experimental result is shown to measure a diffraction grating with a 4.6 micrometers synthetic wavelength.

Citation Download Citation

Ribun Onodera and Yukihiro Ishii "Two-wavelength laser-diode interferometry with electronic calibration techniques", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); https://doi.org/10.1117/12.132155

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