20 October 1992 Two-wavelength laser-diode interferometry with electronic calibration techniques
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Proceedings Volume 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation; (1992) https://doi.org/10.1117/12.132155
Event: International Symposium on Optical Fabrication, Testing, and Surface Evaluation, 1992, Tokyo, Japan
Abstract
A two-wavelength laser-diode (LD) interferometer has been constructed that is based on a phase-shifting technique with an electronic calibration. The phases are equally shifted in opposite directions to each other on an unbalanced interferometer using two wavelengths changed stepwise by separately varying the currents in dual LDs. A feedback interferometer is described with electronics to calibrate the phase shifts and to lock the interferometer on a phase-shift condition by controlling the bias and modulation currents of both LDs. The experimental result is shown to measure a diffraction grating with a 4.6 micrometers synthetic wavelength.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ribun Onodera, Ribun Onodera, Yukihiro Ishii, Yukihiro Ishii, } "Two-wavelength laser-diode interferometry with electronic calibration techniques", Proc. SPIE 1720, Intl Symp on Optical Fabrication, Testing, and Surface Evaluation, (20 October 1992); doi: 10.1117/12.132155; https://doi.org/10.1117/12.132155
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