25 November 1992 Microstructure and stoichiometry effects in electrochromic sol-gel deposited tungsten oxide films
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Proceedings Volume 1728, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XI: Chromogenics for Smart Windows; (1992) https://doi.org/10.1117/12.130545
Event: Optical Materials Technology for Energy Efficiency and Solar Energy, 1992, Toulouse-Labege, France
Abstract
Thin films produced by dip-coating from tungsten alkoxide solutions are of interest for large area electrochromic (switchable) window coatings. The window systems consist, in part, of a layer of tungsten oxide (WO3) on a layer of indium tin oxide (ITO) on glass substrate. Sol-gel processing has several advantages over other preparation techniques. However, there is the possibility of hydrocarbon residue within the films. Such carbon may restrict the electrochromic performance of the films. Rutherford backscattering spectroscopy (RBS) has been used for determining elemental composition and depth profiles in these film structures. The spectra confirm that sol-gel samples contain a substantial level of a light element, such as carbon. Auger electron spectroscopy supports the estimate obtained for the carbon content. The residual carbon can, however, be burnt out by firing at > 500 degree(s)C. Under certain conditions, a sub-layering is seen in the depth profiles.
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David C. Green, John M. Bell, Geoffrey B. Smith, "Microstructure and stoichiometry effects in electrochromic sol-gel deposited tungsten oxide films", Proc. SPIE 1728, Optical Materials Technology for Energy Efficiency and Solar Energy Conversion XI: Chromogenics for Smart Windows, (25 November 1992); doi: 10.1117/12.130545; https://doi.org/10.1117/12.130545
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