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2 March 1993 Detection of surface microstructure changes by electronic speckle pattern interferometry
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Proceedings Volume 1732, Holographics International '92; (1993) https://doi.org/10.1117/12.140435
Event: Holographics International '92, 1992, London, United Kingdom
Abstract
An extension of a common electronic speckle pattern interferometry system is presented, which in addition to deformation measurements enables the spatially resolved quantitative determination of image decorrelation. In the absence of other decorrelation effects this quantity is directly related to surface microstructure changes of test specimen. Without principal variations of a typical ESPI setup a speckle correlation formalism is implemented based on the phase-shift method. Feasibility and restrictions are illustrated in measurements of water-induced changes of natural stone surfaces.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Gerd Guelker, Klaus D. Hinsch, and Claudia Hoelscher "Detection of surface microstructure changes by electronic speckle pattern interferometry", Proc. SPIE 1732, Holographics International '92, (2 March 1993); https://doi.org/10.1117/12.140435
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