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23 November 1992 Promise of silicon wafer microguides for future neutron optical elements
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Abstract
The usually large cross section of the incident neutron beam is divided in the microguide into a large number of thin slices. This allows the neutron beam to be deviated by a large angle within a short distance and enables the design of an efficient neutron lens by giving the stack an appropriate shape. We present a novel approach for high quality microguides by using thin and thus flexible single crystal silicon wafers as the neutron transmitting medium, coated with optimized neutron reflecting thin-film materials. A crucial issue concerns the reflection coefficient R of the silicon thin-film interface. We have performed neutron transmission measurements through commercially available 200 micrometers thin wafers coated in both sides with nickel. Various rocking curves have been taken on assemblies of straight wafers with neutron pathways from 50 to 200 mm in silicon, and on curved wafers. A reflectivity value of 0.988 +/- 0.005 has been found for a neutron wavelength of 7 angstroms.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David F. R. Mildner, Huaiyu Heather Chen-Mayer, Andreas Magerl, and U. Gruening "Promise of silicon wafer microguides for future neutron optical elements", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130647
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