Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

John F. Ankner; Charles F. Majkrzak

doi:10.1117/12.130637

23 November 1992 Subsurface profile refinement for neutron specular reflectivity (Invited Paper)

John F. Ankner, Charles F. Majkrzak

Proceedings Volume 1738, Neutron Optical Devices and Applications; (1992) https://doi.org/10.1117/12.130637
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.

Citation Download Citation

John F. Ankner and Charles F. Majkrzak "Subsurface profile refinement for neutron specular reflectivity (Invited Paper)", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); https://doi.org/10.1117/12.130637

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