23 November 1992 Subsurface profile refinement for neutron specular reflectivity (Invited Paper)
Author Affiliations +
Abstract
The importance of modeling in the analysis of neutron and x-ray reflectivity data cannot be overstated. For specular reflectivity, the theory is straightforward and one merely needs a flexible pattern for constructing density profiles. We will describe the parameters used in and the limitations of such models.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John F. Ankner and Charles F. Majkrzak "Subsurface profile refinement for neutron specular reflectivity (Invited Paper)", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130637; https://doi.org/10.1117/12.130637
PROCEEDINGS
10 PAGES


SHARE
Advertisement
Advertisement
Back to Top