23 November 1992 Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization
Author Affiliations +
Abstract
Reflectivity and resolution properties of cylindrically bent silicon crystals were investigated for their possible employment as short wavelength monochromators. We report flux density measurements of monochromatic neutrons at the sample position of a conventional diffractometer in the wavelength range from 0.05 nm to 0.09 nm for Si(311) and Si(422) reflections. From the obtained data, the optimum crystal thickness and bending radius for a chosen neutron wavelength and the gain in intensity in comparison with a flat mosaic monochromator can be estimated. Further, the use of momentum space focusing in diffraction experiments is discussed.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Volker Wagner, Volker Wagner, Pavel Mikula, Pavel Mikula, } "Use of focusing by bent perfect Si crystals for short-wavelength neutron monochromatization", Proc. SPIE 1738, Neutron Optical Devices and Applications, (23 November 1992); doi: 10.1117/12.130653; https://doi.org/10.1117/12.130653
PROCEEDINGS
7 PAGES


SHARE
RELATED CONTENT


Back to Top