PROCEEDINGS VOLUME 1740
SAN DIEGO '92 | 22-22 JULY 1992
Optics for High-Brightness Synchrotron Radiation Beamlines
Editor(s): John R. Arthur
IN THIS VOLUME

2 Sessions, 27 Papers, 0 Presentations
Section  (19)
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
Section
Proc. SPIE 1740, Emittance, brilliance, and bandpass issues related to an inclined crystal monochromator, 0000 (20 January 1993); https://doi.org/10.1117/12.142565
Proc. SPIE 1740, Sagittal crystal focusing of undulator radiation with high-heat-load inclined crystals, 0000 (20 January 1993); https://doi.org/10.1117/12.138701
Proc. SPIE 1740, Design and analysis of cooled optical components for synchrotron beamlines, 0000 (20 January 1993); https://doi.org/10.1117/12.138710
Proc. SPIE 1740, Design considerations for mirrors at the Advanced Photon Source, 0000 (20 January 1993); https://doi.org/10.1117/12.138712
Proc. SPIE 1740, Adaptive silicon monochromators for high-heat-load insertion devices, 0000 (20 January 1993); https://doi.org/10.1117/12.138713
Proc. SPIE 1740, X-ray mirrors for high-brilliance synchrotron beamlines: R & D at the ESRF, 0000 (20 January 1993); https://doi.org/10.1117/12.138714
Proc. SPIE 1740, Applications of mosaic crystals to high-brilliance x-ray optics, 0000 (20 January 1993); https://doi.org/10.1117/12.138715
Proc. SPIE 1740, Applications of dynamic x-ray diffraction to advanced synchrotron x-ray optics, 0000 (20 January 1993); https://doi.org/10.1117/12.138716
Proc. SPIE 1740, Dynamical theory of x-ray diffraction by multilayered structures, 0000 (20 January 1993); https://doi.org/10.1117/12.138717
Proc. SPIE 1740, Coherent nuclear resonant optics for third-generation synchrotron radiation sources, 0000 (20 January 1993); https://doi.org/10.1117/12.138692
Proc. SPIE 1740, X-ray microscopy and holography with third-generation sources, 0000 (20 January 1993); https://doi.org/10.1117/12.138693
Proc. SPIE 1740, Performance comparison of hard x-ray plates fabricated by two different methods, 0000 (20 January 1993); https://doi.org/10.1117/12.138694
Proc. SPIE 1740, Circularly polarized x-ray beamline at 6.5-GeV accumulation ring, 0000 (20 January 1993); https://doi.org/10.1117/12.138695
Proc. SPIE 1740, Soft to firm x-ray spectroscopy at a hard x-ray facility: polarization-sensitive experiments, 0000 (20 January 1993); https://doi.org/10.1117/12.138696
Proc. SPIE 1740, XUV synchrotron optical components for the Advanced Light Source: summary of the requirements and the developmental program, 0000 (20 January 1993); https://doi.org/10.1117/12.138697
Proc. SPIE 1740, XUV synchrotron optical components for the Advanced Light Source: fabrication and metrology, 0000 (20 January 1993); https://doi.org/10.1117/12.138698
Proc. SPIE 1740, Characterization of YB66 for use as a soft x-ray monochromator crystal, 0000 (20 January 1993); https://doi.org/10.1117/12.138699
Proc. SPIE 1740, Beamline for microdiffraction and micro small-angle scattering, 0000 (20 January 1993); https://doi.org/10.1117/12.138700
Proc. SPIE 1740, Development of an x-ray microprobe using synchrotron radiation, 0000 (20 January 1993); https://doi.org/10.1117/12.138702
Poster Session
Proc. SPIE 1740, Grooved crystal monochromator operating at Bragg angles near pi/2, 0000 (20 January 1993); https://doi.org/10.1117/12.138703
Proc. SPIE 1740, Nuclear monochromator by grazing incidence antireflection films of 119SnO2, 0000 (20 January 1993); https://doi.org/10.1117/12.138704
Proc. SPIE 1740, High energy resolution, high angular acceptance crystal monochromator, 0000 (20 January 1993); https://doi.org/10.1117/12.138705
Proc. SPIE 1740, Concentration of synchrotron radiation with capillary arrays, 0000 (20 January 1993); https://doi.org/10.1117/12.138706
Proc. SPIE 1740, Moessbauer-Fresnel zone plate as nuclear monochromator, 0000 (20 January 1993); https://doi.org/10.1117/12.138707
Proc. SPIE 1740, Optical design and fabrication of the off-axis paraboloid and ellipsoidal mirrors of beamline for synchrotron radiation biological spectroscopic experiments, 0000 (20 January 1993); https://doi.org/10.1117/12.138708
Proc. SPIE 1740, Concentration of x-rays using tapered capillaries, 0000 (20 January 1993); https://doi.org/10.1117/12.138709
Proc. SPIE 1740, Submicron x-ray imaging and Laue diffraction applications of tapered glass capillaries, 0000 (20 January 1993); https://doi.org/10.1117/12.138711
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