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20 January 1993 Nuclear monochromator by grazing incidence antireflection films of 119SnO2
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Abstract
A nuclear monochromator using grazing incidence anti-reflection (GIAR) films of 119SnO2 coated on a Pd backing mirror was designed, fabricated and characterized. 119SnO2/Pd/quartz GIAR films were synthesized by a magnetron reactive sputtering technique. The films were characterized by x-ray scattering of 23.87 keV synchrotron radiation source. From the measurement of off-resonance reflectivity and the simulation of the resonant nuclear reflectivity, approximately 0.8 reflectivity with 10-2 electronic reflectivity and an energy band width approximately 100 (Gamma) where (Gamma) is a natural line width, at a 2 mrad incident beam angle would be expected. The requirements and alternative methods to improve performance of a GIAR film nuclear monochromator were discussed.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hitoshi Homma, Meiman Kentjana, Ercan E. Alp, Timothy M. Mooney, Thomas S. Toellner, and E. Witthoff "Nuclear monochromator by grazing incidence antireflection films of 119SnO2", Proc. SPIE 1740, Optics for High-Brightness Synchrotron Radiation Beamlines, (20 January 1993); https://doi.org/10.1117/12.138704
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