Hard x-ray microimaging techniques based on phase zone plates

Barry P. Lai; Wenbing Yun; Dan G. Legnini; Y. H. Xiao; John J. Chrzas

doi:10.1117/12.138729

13 January 1993 Hard x-ray microimaging techniques based on phase zone plates

Barry P. Lai, Wenbing Yun, Dan G. Legnini, Y. H. Xiao, John J. Chrzas

Proceedings Volume 1741, Soft X-Ray Microscopy; (1993) https://doi.org/10.1117/12.138729
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

Phase zone plates of high focusing efficiency and submicron resolution have been demonstrated in the hard x-ray region. A scanning microscope based on these focusing optics will create many new applications. Preliminary results in the applications of the microscope are reported here. In the area of imaging, we have utilized absorption contrast to clearly identify the locations of Au and Ni constituents in a sample of two interleaved grids. Micro- EXAFS spectra has also been obtained on a Ni foil. Fluorescence from a nuclear fuel sample, as an example of microanalysis, has revealed the elemental distribution at the interfaces. Lastly, microdiffraction from AgBr crystallites has been studied.

Citation Download Citation

Barry P. Lai, Wenbing Yun, Dan G. Legnini, Y. H. Xiao, and John J. Chrzas "Hard x-ray microimaging techniques based on phase zone plates", Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); https://doi.org/10.1117/12.138729

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