13 January 1993 Image reconstruction for x-ray holographic microscopy
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Abstract
Soft x-ray microscopy offers the potential of extending imaging system resolutions below 100 nm with less destructive specimen preparation than electron microscopy. Imaging in the wavelength regime between 10 and 100 angstroms has been demonstrated with several techniques including scanning microscopy, imaging zone-plate microscopy, and Gabor or Fourier holography. Good transverse resolution has been demonstrated in these systems ((iota ) 100 nm) but the longitudinal or depth resolution has been very limited. Our approach to improving depth resolution is to combine multiple views of the object topographically. These systems present unique problems for computational image formation and enhancement.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James M. Brase, Thomas J. Yorkey, James E. Trebes, and Ian McNulty "Image reconstruction for x-ray holographic microscopy", Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138736; https://doi.org/10.1117/12.138736
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