13 January 1993 New results from MAXIMUM: an x-ray scanning photoemission microscope
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Abstract
The scanning soft x-ray photoemission microscope (MAXIMUM) operating at the Synchrotron Radiation Center at the University of Wisconsin-Madison has been substantially upgraded. The major upgrades are: installation of a new beam line that is optimized for the microscope; new optical mount and alignment system for the Schwarzschild objective; a new scanning stage; installation of a cylindrical mirror analyzer; implementation of an ultrahigh vacuum sample preparation chamber and transfer system; a new window-driven data acquisition program that is more flexible and user-friendly. The new system had demonstrated better than 0.1 micrometers spatial resolution, and photoemission data with 350 meV energy resolution has been obtained.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
W. Ng, W. Ng, Avijit K. Ray-Chaudhuri, Avijit K. Ray-Chaudhuri, S. H. Liang, S. H. Liang, John T. Welnak, John T. Welnak, John P. Wallace, John P. Wallace, S. Singh, S. Singh, Cristiano Capasso, Cristiano Capasso, Franco Cerrina, Franco Cerrina, Giorgio Margaritondo, Giorgio Margaritondo, James H. Underwood, James H. Underwood, Jeffrey B. Kortright, Jeffrey B. Kortright, Rupert C. C. Perera, Rupert C. C. Perera, } "New results from MAXIMUM: an x-ray scanning photoemission microscope", Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138744; https://doi.org/10.1117/12.138744
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