13 January 1993 Soft x-ray microscopy with a 182-angstrom soft x-ray laser
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The high brightness and short pulse duration of soft x-ray lasers provide unique advantages for x-ray microscopy. We briefly review soft x-ray laser development at Princeton University and present results from the development of novel soft x-ray microscopes. The Princeton soft x- ray laser at 18.2 nm has been used to record high resolution contact images of biological specimens. More recently we have demonstrated proof-of-principle of reflection imaging in the soft x-ray wavelength range with the first results from a soft x-ray reflection imaging microscope. The microscope used a Schwarzschild objective with Mo/Si multilayer mirrors (normal incidence reflectivity of approximately 20% per surface) to form an image in reflected 18.2 nm soft x rays. In a separate experiment a novel `diffraction plate,' designed as an alternative to conventional condenser optics, has been tested.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Darrell S. DiCicco, Darrell S. DiCicco, Dong-Su Kim, Dong-Su Kim, Leonid Polonskiy, Leonid Polonskiy, Charles H. Skinner, Charles H. Skinner, Szymon Suckewer, Szymon Suckewer, "Soft x-ray microscopy with a 182-angstrom soft x-ray laser", Proc. SPIE 1741, Soft X-Ray Microscopy, (13 January 1993); doi: 10.1117/12.138757; https://doi.org/10.1117/12.138757


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