PROCEEDINGS VOLUME 1742
SAN DIEGO '92 | 22-22 JULY 1992
Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
AXAF Grazing Incidence Mirrors I
Proc. SPIE 1742, AXAF VETA test: an overview, 0000 (21 January 1993); https://doi.org/10.1117/12.140547
AXAF Grazing Incidence Mirrors II
Proc. SPIE 1742, Mirror cell design, fabrication, assembly, and test for the AXAF VETA-I optics, 0000 (21 January 1993); https://doi.org/10.1117/12.140558
AXAF Grazing Incidence Mirrors I
Proc. SPIE 1742, Alignment of the AXAF verification test article-I, 0000 (21 January 1993); https://doi.org/10.1117/12.140568
Proc. SPIE 1742, Intensity distribution of the x-ray source for the AXAF VETA-I mirror test, 0000 (21 January 1993); https://doi.org/10.1117/12.140579
Proc. SPIE 1742, VETA x-ray data acquisition and control system, 0000 (21 January 1993); https://doi.org/10.1117/12.140599
Proc. SPIE 1742, Correcting x-ray spectra obtained from the AXAF VETA-I mirror calibration for pileup, continuum, background, and deadtime, 0000 (21 January 1993); https://doi.org/10.1117/12.140607
Proc. SPIE 1742, AXAF VETA-I mirror encircled energy measurements and data reduction, 0000 (21 January 1993); https://doi.org/10.1117/12.140609
AXAF Grazing Incidence Mirrors II
Proc. SPIE 1742, Precision of the calibration of the AXAF engineering test article mirrors, 0000 (21 January 1993); https://doi.org/10.1117/12.140610
Proc. SPIE 1742, Image analysis of the AXAF VETA-I x-ray mirror, 0000 (21 January 1993); https://doi.org/10.1117/12.140548
Proc. SPIE 1742, Surface finish quality of the outer AXAF mirror pair based on x-ray measurements of the VETA-I, 0000 (21 January 1993); https://doi.org/10.1117/12.140549
Proc. SPIE 1742, Evidence for dust contamination on the VETA-I mirror surface, 0000 (21 January 1993); https://doi.org/10.1117/12.140550
Proc. SPIE 1742, X-ray evidence for particulate contamination on the AXAF VETA-I mirrors, 0000 (21 January 1993); https://doi.org/10.1117/12.140551
AXAF Grazing Incidence Mirrors I
Proc. SPIE 1742, Molecular contamination and the calibration of AXAF, 0000 (21 January 1993); https://doi.org/10.1117/12.140553
AXAF Grazing Incidence Mirrors II
Proc. SPIE 1742, Reflectance calibrations of AXAF mirror samples at absorption edges using synchrotron radiation, 0000 (21 January 1993); https://doi.org/10.1117/12.140554
Grazing Incidence Optics: Theory and High Throughput Optics
Proc. SPIE 1742, High-energy x-ray reflectivity and scattering study from spectrum-x-gamma flight mirrors, 0000 (21 January 1993); https://doi.org/10.1117/12.140555
Proc. SPIE 1742, Optical performance prediction of thin-walled Wolter type I mirror shells for x-rays in the 1- to 8-keV energy range, 0000 (21 January 1993); https://doi.org/10.1117/12.140556
Proc. SPIE 1742, Production of thin-walled lightweight CFRP/EPOXY x-ray mirrors for the XMM telescope, 0000 (21 January 1993); https://doi.org/10.1117/12.140557
Proc. SPIE 1742, Results of x-ray measurements on electroformed mirror shells for the XMM project, 0000 (21 January 1993); https://doi.org/10.1117/12.140559
Proc. SPIE 1742, Code to perform numerical random vibration analysis, 0000 (21 January 1993); https://doi.org/10.1117/12.140560
Proc. SPIE 1742, Application of aberration theory to calculate encircled energy of Wolter I-II telescopes, 0000 (21 January 1993); https://doi.org/10.1117/12.140561
Proc. SPIE 1742, Measurement and analysis of a set of mandrels for the JET-X x-ray optics, 0000 (21 January 1993); https://doi.org/10.1117/12.140562
Multilayer Mirror Fabrication and Characterization
Proc. SPIE 1742, Tuning multilayered mirror light traps for rejection of 30.4-nm radiation, 0000 (21 January 1993); https://doi.org/10.1117/12.140563
Proc. SPIE 1742, Graded period multilayer structures for x-ray optics, 0000 (21 January 1993); https://doi.org/10.1117/12.140564
Proc. SPIE 1742, W/C multilayers deposited on plastic films, 0000 (21 January 1993); https://doi.org/10.1117/12.140565
Proc. SPIE 1742, New test facility for reflectivity measurements in the extreme ultraviolet spectral region, 0000 (21 January 1993); https://doi.org/10.1117/12.140566
Proc. SPIE 1742, Multilayer diffraction at 104-keV, 0000 (21 January 1993); https://doi.org/10.1117/12.140567
Proc. SPIE 1742, Ni/C and Rh/C multilayers for soft x-ray optics: influence of the deposition conditions on the nanostructure, 0000 (21 January 1993); https://doi.org/10.1117/12.140569
Proc. SPIE 1742, Soft x-ray reflectometry program at the National Insitute of Standards and Technology, 0000 (21 January 1993); https://doi.org/10.1117/12.140570
Proc. SPIE 1742, Characterization of WCx/B4C multilayers sputtered in argon/methane atmospheres, 0000 (21 January 1993); https://doi.org/10.1117/12.140571
Poster Session
Proc. SPIE 1742, Characterization of molybdenum/silicon multilayers deposited by ion beam sputtering and rf magnetron sputtering, 0000 (21 January 1993); https://doi.org/10.1117/12.140572
X-Ray/EUV Filters, Gratings, and Polarizers
Proc. SPIE 1742, Experiences with thin-film filter development for the extreme ultraviolet explorer, 0000 (21 January 1993); https://doi.org/10.1117/12.140573
Proc. SPIE 1742, Multilayer thin-film design as far-ultraviolet quarterwave retarders, 0000 (21 January 1993); https://doi.org/10.1117/12.140574
Proc. SPIE 1742, Multilayer thin-film design as far-ultraviolet polarizers, 0000 (21 January 1993); https://doi.org/10.1117/12.140575
Proc. SPIE 1742, Polarimetry of HI Lyman-alpha for coronal magnetic field diagnostics, 0000 (21 January 1993); https://doi.org/10.1117/12.140576
Proc. SPIE 1742, Design and fabrication of the all-reflecting H-Lyman alpha coronagraph/polarimeter, 0000 (21 January 1993); https://doi.org/10.1117/12.140577
Proc. SPIE 1742, Interferometric methods for assessment of toroidal diffraction grating performance, 0000 (21 January 1993); https://doi.org/10.1117/12.140578
Proc. SPIE 1742, Fabrication and performance of linear multilayer gratings in the 44-130 Angstrom wavelength range, 0000 (21 January 1993); https://doi.org/10.1117/12.140580
Proc. SPIE 1742, Multilayer phase-diffraction gratings modeled as a structure in three dimensions, 0000 (21 January 1993); https://doi.org/10.1117/12.140581
Proc. SPIE 1742, Thin-film filter lifetesting results in the extreme ultraviolet, 0000 (21 January 1993); https://doi.org/10.1117/12.140582
X-Ray Telescopes and Observatories
Proc. SPIE 1742, Multispectral solar telescope array: initial results and future plans, 0000 (21 January 1993); https://doi.org/10.1117/12.140583
Poster Session
Proc. SPIE 1742, Uniformity results of the multilayer mirrors used in the ALEXIS ultrasoft x-ray telescopes, 0000 (21 January 1993); https://doi.org/10.1117/12.140584
X-Ray Telescopes and Observatories
Proc. SPIE 1742, Manufacturing, metrology, and assembly of the mirror system for the CDS-EM, 0000 (21 January 1993); https://doi.org/10.1117/12.140585
Poster Session
Proc. SPIE 1742, Ultrahigh-resolution images of the solar chromosphere and corona using coordinated rocket and balloon observations, 0000 (21 January 1993); https://doi.org/10.1117/12.140586
X-Ray Telescopes and Observatories
Proc. SPIE 1742, Ultrahigh-resolution photographic films for x-ray/EUV/FUV astronomy, 0000 (21 January 1993); https://doi.org/10.1117/12.140587
Multilayer Optics for X-Ray Projection Lithography
Proc. SPIE 1742, Present and future requirements of soft x-ray projection lithography, 0000 (21 January 1993); https://doi.org/10.1117/12.140589
Proc. SPIE 1742, Large-area soft x-ray projection lithography using multilayer mirrors structured by RIE, 0000 (21 January 1993); https://doi.org/10.1117/12.140591
Proc. SPIE 1742, Fabrication, thermal stability, and reflectivity measurements of Mo/Si multilayers as x-ray mirrors and other optical components, 0000 (21 January 1993); https://doi.org/10.1117/12.140592
Proc. SPIE 1742, Source of soft x-rays with an x-ray optical system for submicron lithography, 0000 (21 January 1993); https://doi.org/10.1117/12.140593
AXAF Grazing Incidence Mirrors I
Proc. SPIE 1742, Motion detection system for AXAF x-ray ground testing, 0000 (21 January 1993); https://doi.org/10.1117/12.140594
X-Ray Telescopes and Observatories
Proc. SPIE 1742, Chromospheric and coronal observations with multilayer optics, 0000 (21 January 1993); https://doi.org/10.1117/12.140595
Poster Session
Proc. SPIE 1742, Imaging Schwarzschild multilayer x-ray microscope, 0000 (21 January 1993); https://doi.org/10.1117/12.140596