Translator Disclaimer
21 January 1993 X-ray reflectivity of the AXAF VETA-I optics
Author Affiliations +
The study measures the X-ray reflectivity of the AXAF VETA-I optic and compares it with theoretical predictions. Measurements made at energies of 0.28, 0.9, 1.5, 2.1, and 2.3 keV are compared with predictions based on ray trace calculations. Results on the variation of the reflectivity with energy as well as the absolute value of the reflectivity are presented. A synchrotron reflectivity measurement with a high-energy resolution over the range 0.26 to 1.8 keV on a flat Zerodur sample is also reported. Evidence is found for contamination of the flat by a thin layer of carbon on the surface, and the possibility of alteration of the surface composition of the VETA-I mirror, perhaps by the polishing technique. The overall agreement between the measured and calculated effective area of VETA-I is between 2.6 and 10 percent. Measurements at individual energies deviate from the best-fitting calculation to 0.3 to 0.8 percent, averaging 0.6 percent at energies below the high energy cutoff of the mirror reflectivity, and are as high as 20.7 percent at the cutoff.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Edwin M. Kellogg, George Chartas, Dale E. Graessle, John P. Hughes, Leon P. Van Speybroeck, Ping Zhao, Martin C. Weisskopf, Ronald F. Elsner, and Stephen L. O'Dell "X-ray reflectivity of the AXAF VETA-I optics", Proc. SPIE 1742, Multilayer and Grazing Incidence X-Ray/EUV Optics for Astronomy and Projection Lithography, (21 January 1993);


Solar X-ray Imager (SXI) optical performance analysis
Proceedings of SPIE (July 18 1996)
Calibrating the wings of the Chandra PSF
Proceedings of SPIE (February 02 2004)
Molecular contamination and the calibration of AXAF
Proceedings of SPIE (January 20 1993)
Grazing incidence x ray reflectivity studies for the AXAF...
Proceedings of SPIE (December 31 1991)

Back to Top