8 October 1992 Long-range effects of gain depression in microchannel plates
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Abstract
It has been found that the gain depression in MCP's operated at high gains is a relatively long range phenomenon. Active pores can significantly depress the gain in the surrounding quiescent pores at distances of the order of millimeters. This is of fundamental importance for detectors in which high point source count rates are encountered. We have measured this effect for a variety of plate operating conditions and point source count rates and find that in all cases there is a constant limiting radius. We have also determined that the gain depression has a long term effect on the MCP.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Michael L. Edgar, Michael L. Edgar, Alan Smith, Alan Smith, Jonathan S. Lapington, Jonathan S. Lapington, } "Long-range effects of gain depression in microchannel plates", Proc. SPIE 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III, (8 October 1992); doi: 10.1117/12.130690; https://doi.org/10.1117/12.130690
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