8 October 1992 Microstrip proportional-counter development at MSFC
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Microstrip detectors are an exciting new development in proportional counter design in which the planes of discrete anode and cathode wires are replaced by conducting strips on an insulating or partially insulating substrate. The microstrips are fabricated using integrated circuit-type photolithography techniques and therefore offer very high spatial accuracy and uniformity. A development program is underway at Marshall Space Flight Center (MSFC) to produce large-area microstrips for use in an x-ray detector balloon flight program and to investigate the general performance limits of these new devices. Microstrips tested so far have been fabricated both in-house using standard photolithographic techniques and by an outside contractor using electron beam technology. Various substrate materials have been tested along with different electrode configurations. The distributions of pickup on subdivided cathodes on both top and bottom surfaces of the microstrips are also being investigated for use as two- dimensional imaging detectors. Data from these tests in the development of a large-area device will be presented.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Melinda Ann Fulton, Melinda Ann Fulton, Jeffery J. Kolodziejczak, Jeffery J. Kolodziejczak, Brian D. Ramsey, Brian D. Ramsey, } "Microstrip proportional-counter development at MSFC", Proc. SPIE 1743, EUV, X-Ray, and Gamma-Ray Instrumentation for Astronomy III, (8 October 1992); doi: 10.1117/12.130673; https://doi.org/10.1117/12.130673


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