PROCEEDINGS VOLUME 1746
SAN DIEGO '92 | 22-22 JULY 1992
Polarization Analysis and Measurement
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
Advances in Polarimetry I
Proc. SPIE 1746, Polarization analysis based on grating conical diffraction, 0000 (11 December 1992); doi: 10.1117/12.142569
Proc. SPIE 1746, Polarized light-scattering applications and measurements of fundamentalsystems, 0000 (11 December 1992); doi: 10.1117/12.138784
Proc. SPIE 1746, Advanced Stokes polarimeter: a new instrument for solar magnetic field research, 0000 (11 December 1992); doi: 10.1117/12.138795
Proc. SPIE 1746, Scanning laser polarimetry of the retinal nerve fiber layer, 0000 (11 December 1992); doi: 10.1117/12.138806
Proc. SPIE 1746, Polarimeter for mapping spatial distribution of dynamic state of polarization, 0000 (11 December 1992); doi: 10.1117/12.138814
Proc. SPIE 1746, Precision polarimetry of polarization components, 0000 (11 December 1992); doi: 10.1117/12.138815
Polarization Analysis I
Proc. SPIE 1746, Mechanics of polarization ray tracing, 0000 (11 December 1992); doi: 10.1117/12.138816
Proc. SPIE 1746, Exploiting spatial transformations of the light state for precise ellipsometry, 0000 (11 December 1992); doi: 10.1117/12.138775
Proc. SPIE 1746, Three-dimensional image formation and restoration in an optical microscope with polarization aberrations, 0000 (11 December 1992); doi: 10.1117/12.138776
Proc. SPIE 1746, Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study, 0000 (11 December 1992); doi: 10.1117/12.138777
Proc. SPIE 1746, Systems-level polarization modeling of multispectral space sensors, 0000 (11 December 1992); doi: 10.1117/12.138778
Proc. SPIE 1746, Polarization ray tracing in anisotropic optically active media, 0000 (11 December 1992); doi: 10.1117/12.138779
Proc. SPIE 1746, Effects of incoherent scattering on ellipsometry, 0000 (11 December 1992); doi: 10.1117/12.138780
Proc. SPIE 1746, Polarization analysis of bulk-optic Faraday current sensor with a triangular configuration, 0000 (11 December 1992); doi: 10.1117/12.138781
Proc. SPIE 1746, Coating-induced wavefront aberrations, 0000 (11 December 1992); doi: 10.1117/12.138782
Polarization Analysis II
Proc. SPIE 1746, Linear polarization sensitivity specifications for spaceborne instruments, 0000 (11 December 1992); doi: 10.1117/12.138783
Proc. SPIE 1746, Transparent binary-thickness coatings on metal substrates that produce binary patterns of orthogonal elliptical polarization states in reflected light, 0000 (11 December 1992); doi: 10.1117/12.138785
Proc. SPIE 1746, Alignment technique for polarization-based optical systems, 0000 (11 December 1992); doi: 10.1117/12.138786
Mathematics of Polarization and Scattering
Proc. SPIE 1746, Unified formalism for treating polarization effects using Stokes parameters and the Lorentz group, 0000 (11 December 1992); doi: 10.1117/12.138787
Proc. SPIE 1746, Lorentz transformations on Stokes vectors, 0000 (11 December 1992); doi: 10.1117/12.138788
Proc. SPIE 1746, Generalized diattenuation and retardance for inhomogeneous polarization elements, 0000 (11 December 1992); doi: 10.1117/12.138789
Proc. SPIE 1746, Brown's polarization formalism applied to analogous dynamical systems, 0000 (11 December 1992); doi: 10.1117/12.138790
Proc. SPIE 1746, Some necessary conditions on Mueller matrices, 0000 (11 December 1992); doi: 10.1117/12.138791
Advances in Polarimetry II
Proc. SPIE 1746, High-speed ellipsometry for the production of thin metal layers, 0000 (11 December 1992); doi: 10.1117/12.138792
Proc. SPIE 1746, Mueller matrix algorithms, 0000 (11 December 1992); doi: 10.1117/12.138793
Proc. SPIE 1746, Differential reflection of circularly polarized light from a naturally optically active medium, 0000 (11 December 1992); doi: 10.1117/12.138794
Proc. SPIE 1746, Refractive-index and thickness measurements for an anisotropic film by S- and P-polarized reflectances, 0000 (11 December 1992); doi: 10.1117/12.138796
Proc. SPIE 1746, Birefringence characterization using transmission ellipsometry, 0000 (11 December 1992); doi: 10.1117/12.138797
Proc. SPIE 1746, Crosstalk in solar polarization measurements, 0000 (11 December 1992); doi: 10.1117/12.138798
Proc. SPIE 1746, Mueller matrix measurements with an out-of-plane polarimetric scatterometer, 0000 (11 December 1992); doi: 10.1117/12.138799
Proc. SPIE 1746, Complete measurement of Kerr parameters by using rotating-analyzer magneto-optic spectroscopy, 0000 (11 December 1992); doi: 10.1117/12.138800
Proc. SPIE 1746, Laser polarimeter magnetic spectrometer, 0000 (11 December 1992); doi: 10.1117/12.138801
Proc. SPIE 1746, Computer-aided polarimetry involving nonideal optical components, 0000 (11 December 1992); doi: 10.1117/12.138802
Proc. SPIE 1746, Polarization-based phase-shifting method for shape contours, 0000 (11 December 1992); doi: 10.1117/12.138803
Polarization Properties of Detectors
Proc. SPIE 1746, Linear diattenuation of a front-side-illuminated CCD, 0000 (11 December 1992); doi: 10.1117/12.138804
Proc. SPIE 1746, Polarization-sensitive Schottky photodiode, 0000 (11 December 1992); doi: 10.1117/12.138805
Polarization of Optical Elements
Proc. SPIE 1746, Waveplates from stretched glass, 0000 (11 December 1992); doi: 10.1117/12.138807
Proc. SPIE 1746, Off-axis polarizing properties of polarizing beamsplitter cubes, 0000 (11 December 1992); doi: 10.1117/12.138808
Proc. SPIE 1746, Efficient polarizers for infrared ellipsometry, 0000 (11 December 1992); doi: 10.1117/12.138809
Proc. SPIE 1746, High-efficiency reflection polarizer based on light interference in a Buried Low-INDex (BLIND) layer in a high-index substrate at high angles of incidence, 0000 (11 December 1992); doi: 10.1117/12.138810
Proc. SPIE 1746, Design and analysis of a depolarizer for the NASA MODerate-resolution Imaging Spectrometer-Tilt (MODIS-T), 0000 (11 December 1992); doi: 10.1117/12.138811
Proc. SPIE 1746, DC bias modulation characteristics of longitudinal KD*P modulators, 0000 (11 December 1992); doi: 10.1117/12.138812
Proc. SPIE 1746, Characterization of ion-exchanged waveguides for integrated-optical polarization devices, 0000 (11 December 1992); doi: 10.1117/12.138813
Back to Top