11 December 1992 Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study
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Abstract
Polarization analysis software that employs Jones matrix formalism to calculate the polarization sensitivity of an instrument design was developed at Hughes Danbury Optical Systems. The code is capable of analyzing the full ray bundle at its angles of incidence for each optical surface. Input is based on the system ray trace and the thin film coating design at each surface. The MODIS-N (Moderate Resolution Imaging Spectrometer) system is used to demonstrate that it is possible to meet stringent requirements on polarization insensitivity associated with planned remote sensing instruments. Analysis indicates that a polarization sensitivity less than or equal to 2 percent was achieved in all desired spectral bands at all pointing angles, per specification. Polarization sensitivities were as high as 10 percent in similar remote sensing instruments.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eugene Waluschka, Eugene Waluschka, Peter R. Silverglate, Peter R. Silverglate, Christ Ftaclas, Christ Ftaclas, Aaron N. Turner, Aaron N. Turner, } "Polarization sensitivity analysis of an earth remote-sensing instrument: the MODIS-N Phase B study", Proc. SPIE 1746, Polarization Analysis and Measurement, (11 December 1992); doi: 10.1117/12.138777; https://doi.org/10.1117/12.138777
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