PROCEEDINGS VOLUME 1752
SAN DIEGO '92 | 22-22 JULY 1992
Current Developments in Optical Design and Optical Engineering II
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
Advanced Optical Manufacturing and Testing I
Proc. SPIE 1752, Building blocks for optical CIM, 0000 (10 December 1992); doi: 10.1117/12.130713
Assembly Methods and Materials for Optical Systems
Proc. SPIE 1752, Integration of a precision stereo microscope into an excimer-laser-beam delivery system, 0000 (10 December 1992); doi: 10.1117/12.130714
Proc. SPIE 1752, Finite-element analysis for LROS telescope, 0000 (10 December 1992); doi: 10.1117/12.130715
Proc. SPIE 1752, Design and performance of an automated video-based laser-beam alignment system, 0000 (10 December 1992); doi: 10.1117/12.130716
Proc. SPIE 1752, Strategies for stable composite structural design, 0000 (10 December 1992); doi: 10.1117/12.130717
Proc. SPIE 1752, Temperature and age effects on the temporal stability of Invar, 0000 (10 December 1992); doi: 10.1117/12.130718
Advanced Optical Manufacturing and Testing I
Proc. SPIE 1752, Advanced matrix-based algorithm for ion-beam milling of optical components, 0000 (10 December 1992); doi: 10.1117/12.130719
Proc. SPIE 1752, Roughness evolution of optical materials induced by ion-beam milling, 0000 (10 December 1992); doi: 10.1117/12.130720
Proc. SPIE 1752, Fabrication of off-axis optical segments, 0000 (10 December 1992); doi: 10.1117/12.130721
Proc. SPIE 1752, Fabrication of high-quality small plano-convex lens, 0000 (10 December 1992); doi: 10.1117/12.130722
Proc. SPIE 1752, Subaperture testing of a large flat mirror, 0000 (10 December 1992); doi: 10.1117/12.130723
Proc. SPIE 1752, Using moire method of measuring optical disks, 0000 (10 December 1992); doi: 10.1117/12.130724
Proc. SPIE 1752, Apparatus for measuring 3.39-um laser beam divergence, 0000 (10 December 1992); doi: 10.1117/12.130725
Proc. SPIE 1752, New method for measuring tunable laser beam divergence, 0000 (10 December 1992); doi: 10.1117/12.130726
Proc. SPIE 1752, Scanning tunneling microscope to evaluate supersmooth surface roughness, 0000 (10 December 1992); doi: 10.1117/12.130727
Proc. SPIE 1752, Computer-generated hologram to compensate system errors in aspheric surface testing, 0000 (10 December 1992); doi: 10.1117/12.130728
Proc. SPIE 1752, Study on the Hartmann-Shack wavefront sensor, 0000 (10 December 1992); doi: 10.1117/12.130729
Optical Design and Engineering
Proc. SPIE 1752, Vector aberration theory on a spreadsheet: analysis of tilted and decentered systems, 0000 (10 December 1992); doi: 10.1117/12.130730
Proc. SPIE 1752, Toward automatic aberrational weight adjustment by feedback during optimization, 0000 (10 December 1992); doi: 10.1117/12.130731
Proc. SPIE 1752, Double-gauss four-element objective design by using an aspherical surface to correct its aberrations, 0000 (10 December 1992); doi: 10.1117/12.130732
Proc. SPIE 1752, Superresolution optical microscope by the phase-shifting laser spots, 0000 (10 December 1992); doi: 10.1117/12.130733
Proc. SPIE 1752, New design method for athermalized optical systems, 0000 (10 December 1992); doi: 10.1117/12.130734
Contemporary Optical Systems and Devices
Proc. SPIE 1752, Reflecting/refracting objective for microlithography, 0000 (10 December 1992); doi: 10.1117/12.130735
Optical Fabrication and Testing
Proc. SPIE 1752, Replicated optics in the production of "supersmooth" surfaces, 0000 (10 December 1992); doi: 10.1117/12.130736
Proc. SPIE 1752, Design and construction of an astrometric astrograph, 0000 (10 December 1992); doi: 10.1117/12.130737
Proc. SPIE 1752, Mirror substrates for high-power YAG lasers, 0000 (10 December 1992); doi: 10.1117/12.130738
Proc. SPIE 1752, Quantitative criteria for determining the quality of ophthalmic lenses, 0000 (10 December 1992); doi: 10.1117/12.130739
Contemporary Optical Systems and Devices
Proc. SPIE 1752, Unstable resonator with semitransparent output coupler for transverse-flow CO2 laser, 0000 (10 December 1992); doi: 10.1117/12.130740
Proc. SPIE 1752, Portable nanojoule backscatter lidar for environmental sensing, 0000 (10 December 1992); doi: 10.1117/12.130741
Proc. SPIE 1752, Holographic interconnects using bacteriorhodopsin material, 0000 (10 December 1992); doi: 10.1117/12.130742
Proc. SPIE 1752, Study on quartz depolarizer, 0000 (10 December 1992); doi: 10.1117/12.130743
Proc. SPIE 1752, Nonpolarization parallel beamsplitter, 0000 (10 December 1992); doi: 10.1117/12.130744
Proc. SPIE 1752, Low-polarization adjustable beamsplitting angle prism, 0000 (10 December 1992); doi: 10.1117/12.130745
Proc. SPIE 1752, New type of depolarizer of magnesium fluoride, 0000 (10 December 1992); doi: 10.1117/12.130746
Proc. SPIE 1752, Generalized system design of electro-optical device parameters, 0000 (10 December 1992); doi: 10.1117/12.130747
Advanced Optical Manufacturing and Testing II
Proc. SPIE 1752, Technology development at the Center for Optics Manufacturing, 0000 (10 December 1992); doi: 10.1117/12.130748
Proc. SPIE 1752, Center for Optics Manufacturing deterministic microgrinding, 0000 (10 December 1992); doi: 10.1117/12.130749
Proc. SPIE 1752, Opticam SM update, 0000 (10 December 1992); doi: 10.1117/12.130750
Proc. SPIE 1752, Opticam PM machine design, 0000 (10 December 1992); doi: 10.1117/12.130751
Proc. SPIE 1752, Opticim: a computer-integrated manufacturing system for Opticam, 0000 (10 December 1992); doi: 10.1117/12.130752
Proc. SPIE 1752, Process support for Opticam: a concurrent engineering approach, 0000 (10 December 1992); doi: 10.1117/12.130753
Proc. SPIE 1752, Lens-blocking method for Opticam, 0000 (10 December 1992); doi: 10.1117/12.130754
Contemporary Optical Systems and Devices
Proc. SPIE 1752, Exact ray-tracing computation of narcissus-equivalent temperature difference in scanning thermal imagers, 0000 (10 December 1992); doi: 10.1117/12.130755
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