PROCEEDINGS VOLUME 1753
SAN DIEGO '92 | 22-22 JULY 1992
Stray Radiation in Optical Systems II
Editor(s): Robert P. Breault
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
Low-Scatter Optics
Proc. SPIE 1753, Ultralight weight beryllium mirror development, 0000 (12 February 1993); https://doi.org/10.1117/12.140689
Proc. SPIE 1753, Critical parameters for the preparation of low-scatter electroless nickel coatings, 0000 (12 February 1993); https://doi.org/10.1117/12.140699
Proc. SPIE 1753, Beryllium mirror polishing optimization for minimum cost, 0000 (12 February 1993); https://doi.org/10.1117/12.140717
Stray-Light Theory and Concepts
Proc. SPIE 1753, Imaging incoherent, off-axis, scattered radiation, 0000 (12 February 1993); https://doi.org/10.1117/12.140718
Proc. SPIE 1753, Baffle knife-edge radius requirements for exoatmospheric interceptors and surveillance sensors, 0000 (12 February 1993); https://doi.org/10.1117/12.140719
Proc. SPIE 1753, Correcting for diffraction in the far-infrared reflectance measurement of rough surfaces, 0000 (12 February 1993); https://doi.org/10.1117/12.140690
Proc. SPIE 1753, Effect of jet engine exhaust on SOFIA stray-light performance, 0000 (12 February 1993); https://doi.org/10.1117/12.140691
Proc. SPIE 1753, Specular baffles, 0000 (12 February 1993); https://doi.org/10.1117/12.140692
Proc. SPIE 1753, Wavelength dependence of scatter in chemical-vapor-deposited SiC, 0000 (12 February 1993); https://doi.org/10.1117/12.140693
Stray-Light Software and Hardware Tools
Proc. SPIE 1753, Computer modeling of slit diffraction (spatial filtering), 0000 (12 February 1993); https://doi.org/10.1117/12.140694
Proc. SPIE 1753, Very near specular measurement via incident angle scaling, 0000 (12 February 1993); https://doi.org/10.1117/12.140695
Proc. SPIE 1753, Near specular measurements of integrated scatter, 0000 (12 February 1993); https://doi.org/10.1117/12.140696
Proc. SPIE 1753, APMOD: a graphical PC-based preprocessor for APART/PADE, 0000 (12 February 1993); https://doi.org/10.1117/12.140697
Proc. SPIE 1753, PEARLSS: a model for contamination effects--description and results, 0000 (12 February 1993); https://doi.org/10.1117/12.140698
Proc. SPIE 1753, Design review of a broadband three-dimensional scatterometer, 0000 (12 February 1993); https://doi.org/10.1117/12.141438
Stray-Light Analysis
Proc. SPIE 1753, Thermal emissivity analysis of a GEMINI 8-meter telescope design, 0000 (12 February 1993); https://doi.org/10.1117/12.140700
Proc. SPIE 1753, Design and on-orbit performance of the WINDII baffle system, 0000 (12 February 1993); https://doi.org/10.1117/12.140701
Proc. SPIE 1753, Stray light analysis of the Cassini telescope, 0000 (12 February 1993); https://doi.org/10.1117/12.140702
Proc. SPIE 1753, Utilization of Siamese pseudo-optics in APART, 0000 (12 February 1993); https://doi.org/10.1117/12.140703
Proc. SPIE 1753, Using APART for wall visibility calculations in the calibration channel of wide field planetary camera II, 0000 (12 February 1993); https://doi.org/10.1117/12.140704
Bidirectional Reflectance Distribution Function (BRDF) Data
Proc. SPIE 1753, An almost 'perfectly' diffuse, 'perfect' reflector for far-infrared reflectance calibration, 0000 (12 February 1993); https://doi.org/10.1117/12.140705
Proc. SPIE 1753, Design review of a unique out-of-plane polarimetric scatterometer, 0000 (12 February 1993); https://doi.org/10.1117/12.141440
Proc. SPIE 1753, Mueller matrix measurements of scattered light, 0000 (12 February 1993); https://doi.org/10.1117/12.140706
Proc. SPIE 1753, Retroreflections on a low-tech approach to the measurement of opposition effect, 0000 (12 February 1993); https://doi.org/10.1117/12.140707
Proc. SPIE 1753, Reflective and transmissive scatter from ZnS and ZnSe samples, 0000 (12 February 1993); https://doi.org/10.1117/12.140708
Stray-Light Analysis
Proc. SPIE 1753, Experimental investigation of the scattering function outside the region of shift invariance, 0000 (12 February 1993); https://doi.org/10.1117/12.140709
Bidirectional Reflectance Distribution Function (BRDF) Data
Proc. SPIE 1753, Calculation of signal-to-noise ratio of a monostatic bidirectional laser reflectometer, 0000 (12 February 1993); https://doi.org/10.1117/12.140710
Proc. SPIE 1753, Bidirectional reflectance data to support paint development and signature calculations, 0000 (12 February 1993); https://doi.org/10.1117/12.140711
Stray-Light Software and Hardware Tools
Proc. SPIE 1753, Outline of selection processes for black baffle surfaces in optical systems, 0000 (12 February 1993); https://doi.org/10.1117/12.140712
Stray-Light Analysis
Proc. SPIE 1753, Stray light analysis of the 2.5-meter telescope for the Sloan Digital Sky Survey, 0000 (12 February 1993); https://doi.org/10.1117/12.140713
Stray-Light Software and Hardware Tools
Proc. SPIE 1753, Reviews of black surfaces for space and ground-based optical systems, 0000 (12 February 1993); https://doi.org/10.1117/12.140714
Bidirectional Reflectance Distribution Function (BRDF) Data
Proc. SPIE 1753, Rugged dark materials for stray-light suppression by seeded ion beam texturing, 0000 (12 February 1993); https://doi.org/10.1117/12.140715
Stray-Light Analysis
Proc. SPIE 1753, Advanced Baffles: knife-edged diffuse-absorptive and dual reflective baffles, 0000 (12 February 1993); https://doi.org/10.1117/12.140716
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