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12 February 1993 Near specular measurements of integrated scatter
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Abstract
Measurement of integrated scatter near the specular beam is an excellent way to qualify optics and optical coatings that are used in imaging systems. This paper reviews an instrument design to measure Total Integrated Scatter (TIS) over the range from 0.05 degree(s) to 3.0 degree(s) from specular. The measurement scheme utilizes an integrating plate instead of an integrating sphere.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James A. Bender, Timothy D. Henning, and Marvin L. Bernt "Near specular measurements of integrated scatter", Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); https://doi.org/10.1117/12.140696
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