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12 February 1993 Very near specular measurement via incident angle scaling
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Abstract
A technique for calculating scatter to within a few thousandths of a degree from specular is discussed. Results are given for several mirrors.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John C. Stover and Marvin L. Bernt "Very near specular measurement via incident angle scaling", Proc. SPIE 1753, Stray Radiation in Optical Systems II, (12 February 1993); https://doi.org/10.1117/12.140695
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