18 December 1992 Cryogenic quartz crystal microbalance-characterization and calibration for Midcourse Space Experiment (MSX) program
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Proceedings Volume 1754, Optical System Contamination: Effects, Measurement, Control III; (1992); doi: 10.1117/12.140733
Event: San Diego '92, 1992, San Diego, CA, United States
Abstract
This paper presents the results of an investigation of the operational characteristics of two cryogenically cooled quartz crystal microbalances (CQCM) which are flight units for the Midcourse Space Experiment (MSX) program. The units were operated at temperatures that ranged from 15 K up to 300 K. During the course of this investigation, the CQCMs were temperature cycled over this range for 5 complete warmup/cooldown cycles using warmup rates of 2.5 K/min and 1.0 K/min. There was concern over stop/start operations on orbit wherein the CQCM power could be turned off for some time. The CQCMs were cycled in this manner to determine the return frequency variations after power restoration. A three week drift test at 15 K was carried out to determine the drift in CQCM frequency with time. Temperature effects of the heat sink attached to the CQCM base were also determined by varying this temperature. Finally, films of nitrogen, oxygen, carbon dioxide, and water were deposited at the 15 K base temperature, and a thermogravimetric analysis was done for each of the gases condensed, both for individual gases and for gas mixtures. The results of these analyses will be used to interpret on-orbit analysis of contaminants that are condensed during operation of the SPIRIT III telescope on the MSX satellite.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Robert J. Bryson, A. B. Bailey, Bryan L. Seiber, William T. Bertrand, John H. Jones, Bob E. Wood, "Cryogenic quartz crystal microbalance-characterization and calibration for Midcourse Space Experiment (MSX) program", Proc. SPIE 1754, Optical System Contamination: Effects, Measurement, Control III, (18 December 1992); doi: 10.1117/12.140733; https://doi.org/10.1117/12.140733
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KEYWORDS
Crystals

Gases

Nitrogen

Temperature metrology

Contamination

Oxygen

Quartz

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