PROCEEDINGS VOLUME 1755
SAN DIEGO '92 | 22-22 JULY 1992
Interferometry: Techniques and Analysis
SAN DIEGO '92
22-22 July 1992
San Diego, CA, United States
Phase-Shifting Interferometric Techniques
Proc. SPIE 1755, New seven-sample symmetrical phase-shifting algorithm, 0000 (5 February 1993); doi: 10.1117/12.140762
Proc. SPIE 1755, Peak fringe scanning microscopy: submicron 3D measurement of semiconductor components, 0000 (5 February 1993); doi: 10.1117/12.140772
Proc. SPIE 1755, Absolute measurements of 3D shape using white-light interferometer, 0000 (5 February 1993); doi: 10.1117/12.140782
Proc. SPIE 1755, Phase-stepping digital speckle-pattern interferometry and its applications, 0000 (5 February 1993); doi: 10.1117/12.140783
Speckle and Holographic Techniques
Proc. SPIE 1755, Speckle reduction by virtual spatial coherence, 0000 (5 February 1993); doi: 10.1117/12.140784
Proc. SPIE 1755, Three-dimensional graphics techniques applied to the rendering of holographic interferometric data, 0000 (5 February 1993); doi: 10.1117/12.140785
Proc. SPIE 1755, Stepped strobe phase CAH technique for measuring vibration amplitude and phase, 0000 (5 February 1993); doi: 10.1117/12.140786
Proc. SPIE 1755, Recent advances in interferometric endoscopy, 0000 (5 February 1993); doi: 10.1117/12.140787
Proc. SPIE 1755, Holographic recording of large-aperture, high-efficiency, high-damage-threshold, transmission diffraction gratings, 0000 (5 February 1993); doi: 10.1117/12.140754
Special Interferometric Techniques I
Proc. SPIE 1755, Holo-tomographic technique for determination of surface displacement in obstructed areas, 0000 (5 February 1993); doi: 10.1117/12.140755
Proc. SPIE 1755, Contouring of a free oil surface, 0000 (5 February 1993); doi: 10.1117/12.140756
Special Interferometric Techniques II
Proc. SPIE 1755, New configurations for the rotating shear-plate interferometer, a.k.a. shear madness, 0000 (5 February 1993); doi: 10.1117/12.140757
Special Interferometric Techniques I
Proc. SPIE 1755, High-accuracy white-light optical piston sensor for segmented optics, 0000 (5 February 1993); doi: 10.1117/12.140758
Proc. SPIE 1755, Study of Fabry-Perot interferometer for ultraprecise measurement of thermal coefficients of very low expansion, 0000 (5 February 1993); doi: 10.1117/12.140759
Special Interferometric Techniques II
Proc. SPIE 1755, Investigation of submillimeter components by heterodyne holographic interferometry and computational methods, 0000 (5 February 1993); doi: 10.1117/12.140760
Proc. SPIE 1755, Digital moire technique for collimation testing, 0000 (5 February 1993); doi: 10.1117/12.140761
Proc. SPIE 1755, Electronic XOR logic moire technique and its application in 3D machine vision, 0000 (5 February 1993); doi: 10.1117/12.140763
Special Interferometric Techniques III
Proc. SPIE 1755, Optimization of setups by means of geometric functions, 0000 (5 February 1993); doi: 10.1117/12.140764
Proc. SPIE 1755, Measurement of displacement vector fields based on high-precision phase measurement, 0000 (5 February 1993); doi: 10.1117/12.140765
Proc. SPIE 1755, Stationary Fourier spectrometer, 0000 (5 February 1993); doi: 10.1117/12.140766
Proc. SPIE 1755, Methods of extracting and registering shock wave fronts from series interferograms of transient flow field, 0000 (5 February 1993); doi: 10.1117/12.140767
Proc. SPIE 1755, Method of rapid fringe thinning for flow-field interferograms, 0000 (5 February 1993); doi: 10.1117/12.140768
Proc. SPIE 1755, Improvement of optical heterodyne interferometric microscope, 0000 (5 February 1993); doi: 10.1117/12.140769
Interferometry: Analysis I
Proc. SPIE 1755, Spatial and temporal phase-measurement techniques: a comparison of major error sources in one dimension, 0000 (5 February 1993); doi: 10.1117/12.140770
Proc. SPIE 1755, Wavefront integration from difference data, 0000 (5 February 1993); doi: 10.1117/12.140771
Proc. SPIE 1755, Propagation of errors in different phase-shifting algorithms: a special property of the arctangent function, 0000 (5 February 1993); doi: 10.1117/12.140773
Proc. SPIE 1755, Vector formulation for Ronchi shear surface fitting, 0000 (5 February 1993); doi: 10.1117/12.140774
Interferometry: Analysis II
Proc. SPIE 1755, Transform method of processing for speckle strain gauge measurements, 0000 (5 February 1993); doi: 10.1117/12.140775
Proc. SPIE 1755, Expert system for analysis of complicated fringe patterns, 0000 (5 February 1993); doi: 10.1117/12.140776
Proc. SPIE 1755, Software package for interferometric refractive index distribution measurement, 0000 (5 February 1993); doi: 10.1117/12.140777
Proc. SPIE 1755, Application of automatic fringe analysis techniques in the automotive industry, 0000 (5 February 1993); doi: 10.1117/12.140778
Proc. SPIE 1755, Statistical analysis of phase-stepping digital speckle-pattern interferometry, 0000 (5 February 1993); doi: 10.1117/12.140779
Proc. SPIE 1755, Statistical properties of spatial phase distribution in developed speckle field, 0000 (5 February 1993); doi: 10.1117/12.140780
Special Interferometric Techniques I
Proc. SPIE 1755, Three-wave lateral shearing interferometer, 0000 (5 February 1993); doi: 10.1117/12.140781
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