Expert system for analysis of complicated fringe patterns

Malgorzata Kujawinska

doi:10.1117/12.140776

5 February 1993 Expert system for analysis of complicated fringe patterns

Malgorzata Kujawinska

Proceedings Volume 1755, Interferometry: Techniques and Analysis; (1993) https://doi.org/10.1117/12.140776
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

The review of the advantages and disadvantages of analytical phase measurement methods of automatic fringe pattern analysis is given. The pros and cons for their applications due to the complexity of an interferogram, the accuracies required, and the type of a quantity measured are considered. The architecture of the system which enables the proper choice between Fourier transform method, temporal and spatial phase-shifting methods is described. The error considerations for these errors are given. The philosophy of the expert system which should apply the various image processing and phase-measuring possibilities in the most efficient way is presented.

Citation Download Citation

Malgorzata Kujawinska "Expert system for analysis of complicated fringe patterns", Proc. SPIE 1755, Interferometry: Techniques and Analysis, (5 February 1993); https://doi.org/10.1117/12.140776

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available