5 February 1993 Expert system for analysis of complicated fringe patterns
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Abstract
The review of the advantages and disadvantages of analytical phase measurement methods of automatic fringe pattern analysis is given. The pros and cons for their applications due to the complexity of an interferogram, the accuracies required, and the type of a quantity measured are considered. The architecture of the system which enables the proper choice between Fourier transform method, temporal and spatial phase-shifting methods is described. The error considerations for these errors are given. The philosophy of the expert system which should apply the various image processing and phase-measuring possibilities in the most efficient way is presented.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Malgorzata Kujawinska, "Expert system for analysis of complicated fringe patterns", Proc. SPIE 1755, Interferometry: Techniques and Analysis, (5 February 1993); doi: 10.1117/12.140776; https://doi.org/10.1117/12.140776
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