2 February 1993 Chalcogenide glass thin films: Z-Scan measurements of refractive index changes
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Abstract
Nonlinear properties of chacolgenide glass A52S3 thin films have been measured with a self-diffraction (Z-Scan) technique. Photostructural changes and dynamical effects have been measured.
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Francesco Michelotti, Francesco Michelotti, Mario Bertolotti, Mario Bertolotti, Valentin N. Ciumash, Valentin N. Ciumash, Andrei M. Andriesh, Andrei M. Andriesh, } "Chalcogenide glass thin films: Z-Scan measurements of refractive index changes", Proc. SPIE 1773, Photonics for Computers, Neural Networks, and Memories, (2 February 1993); doi: 10.1117/12.983231; https://doi.org/10.1117/12.983231
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