Ellipsometry techniques in thin-film electro-optic coefficients measurements

Yves Levy; Pierre-Alain Chollet; Gregory Gadret; Francois Kajzar

doi:10.1117/12.139206

25 February 1993 Ellipsometry techniques in thin-film electro-optic coefficients measurements

Yves Levy, Pierre-Alain Chollet, Gregory Gadret, Francois Kajzar

Proceedings Volume 1775, Nonlinear Optical Properties of Organic Materials V; (1993) https://doi.org/10.1117/12.139206
Event: San Diego '92, 1992, San Diego, CA, United States

Abstract

In this paper, a review of some different experimental methods employed for measuring the electrooptic coefficients (Pockels effect and Kerr effect) are presented, together with the most recent technique proposed by Teng and Man. For this last method, the limit of validity of a simplified method is established. A rigorous derivation is also given for studying such polymer films when the wavelength of the light beam is close to the absorption band.

Citation Download Citation

Yves Levy, Pierre-Alain Chollet, Gregory Gadret, and Francois Kajzar "Ellipsometry techniques in thin-film electro-optic coefficients measurements", Proc. SPIE 1775, Nonlinear Optical Properties of Organic Materials V, (25 February 1993); https://doi.org/10.1117/12.139206

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