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15 December 1992 Decenter and defocus for testing aspheric surfaces
Der-Shen Wan
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Proceedings Volume 1776, Interferometry: Surface Characterization and Testing; (1992) https://doi.org/10.1117/12.139236
Event: San Diego '92, 1992, San Diego, CA, United States
Abstract
Testing profiles of aspheric surfaces at various stages of figuring is essential, and a simple algorithm for finding the surface profile is very helpful. In order to find the wave front fourth order spherical aberration, a new algorithm resorting to decenter and defocus is presented here.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
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Der-Shen Wan, Der-Shen Wan, } "Decenter and defocus for testing aspheric surfaces", Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139236; https://doi.org/10.1117/12.139236
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