15 December 1992 Rapid surface roughness measurements of coarse objects
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Abstract
A new optical method of rms surface roughness (Rq) measurement for diffusely-reflecting or scattering surfaces with Rq greater than 1 micron is disclosed, and its application to grit- blasted and plasma-sprayed surfaces described. Data acquisition by the 'multiple line shadow' (MLS) method over a small area (typically 4 mm2), image analysis, and Rq readout require at most 10 seconds, with standard deviations of 10% of mean value attainable. Measurements are made by hand-held or automated optical probe at the workpiece, with no necessity to remove the piece from its production jig. The MLS method is absolute; no calibrations are required. When automated, the MLS probe need not touch the nominally flat or large-radius workpiece surface. Minor probe and algorithm modifications allow non-contact measurement of step heights or coating thicknesses in the 1 - 30 mil range (.025 - .75 mm), also in times of 10 seconds or less at the workpiece.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John N. Pike, John N. Pike, "Rapid surface roughness measurements of coarse objects", Proc. SPIE 1776, Interferometry: Surface Characterization and Testing, (15 December 1992); doi: 10.1117/12.139243; https://doi.org/10.1117/12.139243
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