2 September 1992 Vector formulation for interferogram surface fitting
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Proceedings Volume 1779, Optical Design and Processing Technologies and Applications; (1992) https://doi.org/10.1117/12.140942
Event: Optical Engineering Midwest 1992, 1992, Chicago, IL, United States
Abstract
Interferometry is an optical testing technique based on the interference of light. Fringes are formed when the optical path difference (OPD) between a reference beam and an object beam is an integral multiple of the illuminating wavelength. This OPD is extracted through the process of sampling, ordering, and interpolating. This paper develops a linear-algebra vector notation model of the interferogram sampling and interpolation process.
© (1992) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Fischer, David J. Fischer, John T. O'Bryan, John T. O'Bryan, H. Philip Stahl, H. Philip Stahl, } "Vector formulation for interferogram surface fitting", Proc. SPIE 1779, Optical Design and Processing Technologies and Applications, (2 September 1992); doi: 10.1117/12.140942; https://doi.org/10.1117/12.140942
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