PROCEEDINGS VOLUME 1780
OPTICAL SYSTEMS DESIGN '92 | 1-30 SEPTEMBER 1992
Lens and Optical Systems Design
IN THIS VOLUME

1 Sessions, 81 Papers, 0 Presentations
OPTICAL SYSTEMS DESIGN '92
1-30 September 1992
Berlin, Germany
Lens and Optical Systems Design
Proc. SPIE 1780, Front Matter: Volume 1780, 178001 (15 April 1992); doi: 10.1117/12.2303439
Proc. SPIE 1780, Geometrical and physical theory of image formation: a synthesis, 178002 (15 April 1992); doi: 10.1117/12.142802
Proc. SPIE 1780, Global optimization for lens design: an emerging technology, 178003 (15 April 1992); doi: 10.1117/12.142813
Proc. SPIE 1780, Generation of lens designs for optimization, 178004 (15 April 1992); doi: 10.1117/12.142824
Proc. SPIE 1780, Resolution versus depth of focus in the resolution-enhanced optical system for lithography, 178005 (15 April 1992); doi: 10.1117/12.142834
Proc. SPIE 1780, Principles of adaptive optics, 178006 (15 April 1992); doi: 10.1117/12.142842
Proc. SPIE 1780, Standards required for implementation of CIM in optics, 178007 (15 April 1992); doi: 10.1117/12.142851
Proc. SPIE 1780, Human factor considerations for optical design software, 178008 (15 April 1992); doi: 10.1117/12.142860
Proc. SPIE 1780, Development of interactive optical design software under multitasking graphical operating system, 178009 (15 April 1992); doi: 10.1117/12.142869
Proc. SPIE 1780, Combination of global-optimization and expert-systems techniques in optical design, 17800A (15 April 1992); doi: 10.1117/12.142877
Proc. SPIE 1780, Small expert system used in lens design, 17800B (15 April 1992); doi: 10.1117/12.142803
Proc. SPIE 1780, Optical lens design by neural network, 17800C (15 April 1992); doi: 10.1117/12.142805
Proc. SPIE 1780, Simple method for computer-aided lens design with the elements of artifical intelligence, 17800D (15 April 1992); doi: 10.1117/12.142806
Proc. SPIE 1780, New ray-tracing method for radial gradient-index lenses, 17800E (15 April 1992); doi: 10.1117/12.142807
Proc. SPIE 1780, Simplified irradiance/illuminance calculations in optical systems, 17800F (15 April 1992); doi: 10.1117/12.142808
Proc. SPIE 1780, Adjustment and design criteria of lenses in the case of partially coherent imaging, 17800G (15 April 1992); doi: 10.1117/12.142809
Proc. SPIE 1780, Optical simulations and analysis of the asymmetric surface form errors, 17800H (15 April 1992); doi: 10.1117/12.142810
Proc. SPIE 1780, Knowledge-based optical system design: some optical systems generated by the KBOSD, 17800I (15 April 1992); doi: 10.1117/12.142811
Proc. SPIE 1780, Diffraction computation of 'focusator' into longitudinal segment and multifocal lens, 17800J (15 April 1992); doi: 10.1117/12.142812
Proc. SPIE 1780, Interpolation of indices-of-refraction extended-range UV/IR, 17800K (15 April 1992); doi: 10.1117/12.142814
Proc. SPIE 1780, Seeking for global minimum with GSA in lens design, 17800L (15 April 1992); doi: 10.1117/12.142815
Proc. SPIE 1780, Influence of temperature gradients on the performance of ZnSe lenses, 17800M (15 April 1992); doi: 10.1117/12.142816
Proc. SPIE 1780, Use of the Sellmeier dispersion formula for optical glasses and practical implications, 17800N (15 April 1992); doi: 10.1117/12.142817
Proc. SPIE 1780, Inclusion of deformed wavefronts into correction of holographic concave gratings, 17800O (15 April 1992); doi: 10.1117/12.142818
Proc. SPIE 1780, Holographic collimator for laser diodes, 17800P (15 April 1992); doi: 10.1117/12.142819
Proc. SPIE 1780, Hybrid optics for space applications: design, manufacture, and testing, 17800Q (15 April 1992); doi: 10.1117/12.142820
Proc. SPIE 1780, Optimized replication of interferometrically generated deep diffractive structures by embossing into thermoplastics, 17800R (15 April 1992); doi: 10.1117/12.142821
Proc. SPIE 1780, Waveguide Fresnel lenses with curved diopters: a BPM analysis, 17800S (15 April 1992); doi: 10.1117/12.142822
Proc. SPIE 1780, Design of a waveguide grating using Lagrange's integral invariant, 17800T (15 April 1992); doi: 10.1117/12.142823
Proc. SPIE 1780, New optimization method based on a wavefront development generating independent conditions, 17800U (15 April 1992); doi: 10.1117/12.143241
Proc. SPIE 1780, Lens design and tolerance calculations, 17800V (15 April 1992); doi: 10.1117/12.142825
Proc. SPIE 1780, The eikonal function: the commom concept in ray optics and particle mechanics, 17800W (15 April 1992); doi: 10.1117/12.142826
Proc. SPIE 1780, Design of the optical system using GRIN materials, 17800X (15 April 1992); doi: 10.1117/12.142827
Proc. SPIE 1780, Linear axial GRIN lenses: exact ray-trace and paraxial formulas, 17800Y (15 April 1992); doi: 10.1117/12.142828
Proc. SPIE 1780, Color and spatial aplanatism for corrected holographic gratings, 17800Z (15 April 1992); doi: 10.1117/12.142829
Proc. SPIE 1780, Design of an aberration-corrected holographic grating with high spectral and spatial resolution, 178010 (15 April 1992); doi: 10.1117/12.142830
Proc. SPIE 1780, Special diffractive lenses, 178011 (15 April 1992); doi: 10.1117/12.142831
Proc. SPIE 1780, Short derivation of aberrations, stop-shift, and object-shift equations for diffractive optics, 178012 (15 April 1992); doi: 10.1117/12.142832
Proc. SPIE 1780, Numerical investigations of image quality given by holographic lenses recorded on quadrics of revolution, 178013 (15 April 1992); doi: 10.1117/12.142833
Proc. SPIE 1780, Imaging quality of Fourier-transforming diffractive lens, 178014 (15 April 1992); doi: 10.1117/12.142835
Proc. SPIE 1780, Ductile grinding of ultraprecise aspherical optical lenses, 178015 (15 April 1992); doi: 10.1117/12.142836
Proc. SPIE 1780, Single-element plastics aspherics: the economical approach to precision optics, 178016 (15 April 1992); doi: 10.1117/12.142837
Proc. SPIE 1780, Ray tracing in gradient-index materials, 178017 (15 April 1992); doi: 10.1117/12.142838
Proc. SPIE 1780, Output power optimization in laser with nonlinear absorber, 178018 (15 April 1992); doi: 10.1117/12.142839
Proc. SPIE 1780, 80-channel optical recording unit for laser plotter, 178019 (15 April 1992); doi: 10.1117/12.142840
Proc. SPIE 1780, Scale-tunable diffractometer for spatial light modulators: a design procedure, 17801A (15 April 1992); doi: 10.1117/12.142841
Proc. SPIE 1780, Visible/near-infrared spectrometer (VNIR) for the Mars 94 mission, 17801B (15 April 1992); doi: 10.1117/12.142843
Proc. SPIE 1780, SCIAMACHY optical system, 17801C (15 April 1992); doi: 10.1117/12.142844
Proc. SPIE 1780, Polychromatic effects of annular color filters in optical systems, 17801D (15 April 1992); doi: 10.1117/12.142845
Proc. SPIE 1780, Solid state pulsed laser with a fiber-based resonator meets requirements for laser lithotripsy, 17801E (15 April 1992); doi: 10.1117/12.142846
Proc. SPIE 1780, High-brightness laser pulse at 338.4 nm utilizing the SBS and SRS processes, 17801F (15 April 1992); doi: 10.1117/12.142847
Proc. SPIE 1780, Modeling of bistable operation of lasers with nonlinear absorber, 17801G (15 April 1992); doi: 10.1117/12.142848
Proc. SPIE 1780, Quasi-geometrical model of partially coherent beam propagation in real axially symmetric optical systems, 17801H (15 April 1992); doi: 10.1117/12.142849
Proc. SPIE 1780, Focusing of diode lasers for high beam quality in high-power applications, 17801I (15 April 1992); doi: 10.1117/12.142850
Proc. SPIE 1780, Calculation of narcissus effect in scanning systems with detector arrays by exact numerical ray tracing, 17801J (15 April 1992); doi: 10.1117/12.142852
Proc. SPIE 1780, Analog-digital electronic stabilization of optical image, 17801K (15 April 1992); doi: 10.1117/12.142853
Proc. SPIE 1780, Piezo-enhanced multireflection cells applied for in-situ measurements of trace-gas concentrations, 17801L (15 April 1992); doi: 10.1117/12.142854
Proc. SPIE 1780, Theoretical analysis of optical systems subjected to mechanical stress: an application to ISO star sensor design, 17801M (15 April 1992); doi: 10.1117/12.142855
Proc. SPIE 1780, Compact design of a femtosecond single-shot autocorrelator, 17801N (15 April 1992); doi: 10.1117/12.142856
Proc. SPIE 1780, Planetary Fourier spectrometer (PFS) for the MARS 94 mission, 17801O (15 April 1992); doi: 10.1117/12.142857