1 January 1993 All-fiber compact near-field scanning optical microscope
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For overcoming the classical limits of resolution in optical microscopy it is necessary to detect the diffracted signal from the small details of an object in the near field. These light waves interact with the object details and then can be used for determining the object topology. The solution consists of frustrating the evanescent field by means of optical fiber probes. In this present communication a new super-resolution scanning near-field optical microscope using a diode laser ((lambda) equals 1.3 micrometers ) and optical fibers is demonstrated to measure the samples with submicron structure in a noncontact manner. A reproducible method manufacturing of the fiber probes is proposed. First, results dealing with the characterization of the device are reported.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Pavel Tomanek, Pavel Tomanek, Michel Spajer, Michel Spajer, } "All-fiber compact near-field scanning optical microscope", Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.141003; https://doi.org/10.1117/12.141003

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