1 January 1993 Phase detection deflectometry: an industrial solution for three-dimensional form measurement of aspheric and spheric surfaces
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Abstract
Angenieux has developed a device providing a fast, accurate, 3-D analysis of a large range of aspherical and spherical surfaces and wavefronts, from diamond turned IR components to molded or polished lenses and up to large astronomical mirrors. Measurements are achieved without the need for compensating tooling such as null-lenses or holograms.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric Durand, Jean-Marie Bacchus, "Phase detection deflectometry: an industrial solution for three-dimensional form measurement of aspheric and spheric surfaces", Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140969; https://doi.org/10.1117/12.140969
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