1 January 1993 Testing aspherical surfaces using multiple annular interferograms
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We present a technique for interferometrically testing aspherical surfaces without the use of compensating elements. The method consists of recording successive overlapping phase maps from a set of annular interferograms of an aspherical surface, obtained using a conventional phase-shifting interferometer and a micropositioning translator stage. These maps are then sewn together with a suitable algorithm we have developed, and the whole surface error is recovered. Experimental results are shown to be in good agreement with the null lens test performed for comparison.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Mauro Melozzi, Luis Pezzati, and Alessandro Mazzoni "Testing aspherical surfaces using multiple annular interferograms", Proc. SPIE 1781, Specification and Measurement of Optical Systems, (1 January 1993); doi: 10.1117/12.140974; https://doi.org/10.1117/12.140974

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