4 March 1993 New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics
Author Affiliations +
Abstract
Ellipsometric spectra of thick polymer films for non-linear optics were recorded at several angles of incidence. A non-linear regression analysis is used to compare an isotropic model to a uniaxial one. Analysis in the transparent region unambiguously points out the more suitable model, and the corresponding thickness. These results are subsequently used on all the spectrum, including the absorption domains, so as to give the complex ordinary and extraordinary indices. Relevant structural information on the polymer conformation is then inferred.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Eric Toussaere, Joseph Zyss, "New approach to variable-angle spectroscopic ellipsometry in anisotropic uniaxial films: application to oriented polymers for nonlinear optics", Proc. SPIE 1782, Thin Films for Optical Systems, (4 March 1993); doi: 10.1117/12.141009; https://doi.org/10.1117/12.141009
PROCEEDINGS
8 PAGES


SHARE
Back to Top