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Study of the development of failure processes of MOS (MES) LSIC active structures with the help of surface acoustic waves
Possible application of peak effect as high-Tc superconducting sensor for detecting magnetic field sweep rate
Gettering annealing effect on deep-level defect concentration in epitaxial GaAs obtained by chloride method
Control and characterization of semiconductor superlattices by grazing: incidence x-ray diffraction method
Vacuum-plasma deposition of resist film on substrate by means of copolymerization of monomers in the afterglow zone of rf discharge
Pulsed laser-excited microwave photoconductivity applications to high-resolution defect diagnostics of ion- and laser-beam-modified semiconductor surface
Physical and technological aspects of anomalous current-voltage characteristics of Schottky diodes at low temperatures