Gamma-ray vulnerability of light-emitting diodes, injection-laser diodes, and pin photodiodes for 1.3-um-wavelength fiber optics

Gerard Breuze; Jean Serre

doi:10.1117/12.141168

25 February 1993 Gamma-ray vulnerability of light-emitting diodes, injection-laser diodes, and pin photodiodes for 1.3-um-wavelength fiber optics

Gerard Breuze, Jean Serre

Author Affiliations +

Proceedings Volume 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments; (1993) https://doi.org/10.1117/12.141168
Event: Fibers '92, 1992, Boston, MA, United States

Abstract

With the increasing use of optical data links it becomes essential to test for radiation vulnerability not only the transmission support--fiber and cable--but also fiber-end electro- optical components that could be exposed to hostile environment. Numerous silica-based fibers were currently tested over the world. This paper gives a comparison of radiation resistance between two gradient index multimode fibers with and without phosphor in core. From that result a technological change in standard 1.3 micrometers wavelength light-emitting diodes (LEDs), injection-laser diodes (LDs) and p-i-n photodiodes (PDs) was made. Results of tests under steady-state medium dose-rate Co⁶⁰ exposure show a significant enhancement of improved components optical performance. Especially LED and PD present a small degradation of optical characteristics for 50 kGy (for a dose-rate of about a few 10 Gy h^-1). Multicomponent laser-diode modules (LDM) were extensively tested up to about 20 kGy. Two degradation processes clearly appear: a wrong decrease of stimulated light emission after 3 - 4 kGy and a bad operation of thermoelectric element cooler beyond about 10 kGy. Hardened optical data links are now able to withstand successfully some nuclear environments.

Citation Download Citation

Gerard Breuze and Jean Serre "Gamma-ray vulnerability of light-emitting diodes, injection-laser diodes, and pin photodiodes for 1.3-um-wavelength fiber optics", Proc. SPIE 1791, Optical Materials Reliability and Testing: Benign and Adverse Environments, (25 February 1993); https://doi.org/10.1117/12.141168

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