12 July 1993 Far-field diffraction patterns of a dot array with Gaussian random fluctuations
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Proceedings Volume 1806, Optical Computing; (1993) https://doi.org/10.1117/12.147823
Event: Topical Meeting on Optical Computing, 1992, Minsk, Belarus
Abstract
A theoretical and experimental investigation on the far-field diffraction patterns of a dot array with Gaussian random fluctuations has been done quantitatively by means of a generalized fluctuation parameter. It has been found that the exposure condition strongly influences the nature of the observed photographic pattern and hence the observation of the light-depletion phenomenon first reported by Stark and later, analyzed by Martin and Aime.
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Rajagopalan Uma Maheswari, Rajagopalan Uma Maheswari, Toshimitsu Asakura, Toshimitsu Asakura, Nobukatsu Takai, Nobukatsu Takai, } "Far-field diffraction patterns of a dot array with Gaussian random fluctuations", Proc. SPIE 1806, Optical Computing, (12 July 1993); doi: 10.1117/12.147823; https://doi.org/10.1117/12.147823
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