4 May 1993 Laser beam quality of a high-PRF XeCl laser
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Proceedings Volume 1810, 9th International Symposium on Gas Flow and Chemical Lasers; (1993) https://doi.org/10.1117/12.144628
Event: Ninth International Symposium on Gas Flow and Chemical Lasers, 1992, Heraklion, Greece
Abstract
A theoretical analysis is made to describe the influence of an active disturbing medium on the far-field diffraction pattern of an excimer laser beam. Results are in good agreement with experiences. The gas density perturbations induce amplitude and phase aberrations which are responsible for the degradation of the beam characteristics in the far-field.
© (1993) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Olivier P. Uteza, Olivier P. Uteza, Marc L. Sentis, Marc L. Sentis, Philippe Ch. Delaporte, Philippe Ch. Delaporte, Bernard M. Forestier, Bernard M. Forestier, Bernard L. Fontaine, Bernard L. Fontaine, G. P. Lopez, G. P. Lopez, } "Laser beam quality of a high-PRF XeCl laser", Proc. SPIE 1810, 9th International Symposium on Gas Flow and Chemical Lasers, (4 May 1993); doi: 10.1117/12.144628; https://doi.org/10.1117/12.144628
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